DocumentCode :
2249639
Title :
Micro-tribological characteristics of PFPE Zdol lubricant coated on silicon
Author :
Yong-Sik Kim ; Koo-Hyun Chung ; Dae-Eun Kim
Author_Institution :
Center for Inf. Storage Device, Yonsei Univ., Seoul
fYear :
2004
fDate :
16-19 Aug. 2004
Firstpage :
93
Lastpage :
94
Abstract :
The reliability problem is crucial in micro-systems. In order to increase the reliability and durability, new lubrication is needed since conventional lubricant cannot be used in the micro-system. In this work, the fundamental tribological characteristics of perfluoropolyether (PFPE) Fomblin Zdol lubricants with different thickness coated on silicon by dip coating method were investigated. The Zdol lubricant was characterized by ellipsometry, contact angle measurement, X-ray photoelectron spectroscopy (XPS), and atomic force microscope (AFM). Especially, characteristics of unbonded Zdol films were compared with that of bonded Zdol films from the view point of stiction and friction. As a result, optimum thickness of unbonded as well as bonded Zdol film was proposed. Also, it was found that the Zdol films with only bonded fraction had lower stiction/friction coefficient than the Zdol film with unbonded and bonded fraction
Keywords :
X-ray photoelectron spectra; atomic force microscopy; contact angle; ellipsometry; lubricants; lubrication; micromechanical devices; polymers; reliability; silicon; stiction; AFM; Si; X-ray photoelectron spectroscopy; XPS; atomic force microscope; bonded Zdol films; contact angle measurement; dip coating; durability; ellipsometry; friction coefficient; lubrication; microsystem; microtribological characteristics; optimum film thickness; perfluoropolyether Fomblin Zdol lubricants; reliability; stiction coefficient; unbonded Zdol films; Atomic force microscopy; Atomic measurements; Bonding; Dip coating; Ellipsometry; Force measurement; Friction; Lubricants; Lubrication; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asia-Pacific Magnetic Recording Conference, 2004. APMRC 2004
Conference_Location :
Seoul
Print_ISBN :
0-7803-8717-1
Type :
conf
DOI :
10.1109/APMRC.2004.1521967
Filename :
1521967
Link To Document :
بازگشت