• DocumentCode
    2250347
  • Title

    Statistical properties of scattering loss and mode splitting in microdisk resonators

  • Author

    Li, Qing ; Eftekhar, Ali A. ; Adibi, Ali

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2011
  • fDate
    1-6 May 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We report an experimental observation that in high-Q silicon microdisk resonators, the intrinsic Q and mode splitting can vary significantly over the azimuthal orders. A theoretical roughness model qualitatively explains the observed results.
  • Keywords
    integrated optics; micromechanical resonators; optical resonators; high-Q silicon microdisk resonators; mode splitting; scattering loss; statistical properties; Curve fitting; Finite element methods; Optical losses; Optical resonators; Scattering; Silicon; Solids;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2011 Conference on
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    978-1-4577-1223-4
  • Type

    conf

  • Filename
    5951031
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2250347