DocumentCode :
2250682
Title :
Characteristics of optical thin film filters containing nanometer-size particles
Author :
Nonaka, S. ; Suda, T. ; Oda, H.
Author_Institution :
Toyota Technol. Inst., Nagoya, Japan
fYear :
2001
fDate :
Oct. 31 2001-Nov. 2 2001
Firstpage :
206
Lastpage :
207
Abstract :
In this study, several kinds of single-layer optical thin film filters which contain many nanometer-size particles are analyzed by solving Maxwell equations. Typical characteristics of the filters are disclosed, taking into considerations of both effects of surface plasmon and polariton in the nano-particles and polariton in the dielectric thin film; especially the very narrow bandpass property. These significant features are reduced to dipole plasmon and polariton resonances of the nano particles and the layer.
Keywords :
Maxwell equations; band-pass filters; dielectric thin films; light reflection; light transmission; nanostructured materials; optical films; optical filters; polaritons; surface plasmon resonance; Maxwell equations; band-pass characteristics; dielectric thin film; dipole plasmon resonances; nanometer-size particles; narrow band pass filters; optical WDM communication; polariton resonances; single-layer optical thin film filters; surface plasmon; surface polariton; Band pass filters; Dielectric thin films; Filtering theory; Optical films; Optical filters; Optical surface waves; Plasmons; Resonance; Stimulated emission; Wavelength division multiplexing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2001 International
Conference_Location :
Shimane, Japan
Print_ISBN :
4-89114-017-8
Type :
conf
DOI :
10.1109/IMNC.2001.984162
Filename :
984162
Link To Document :
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