Title :
Investigation of Contact Properties in Carbon Nanotube Transistors Using Scanning Photocurrent Microscopy
Author :
Park, Jaeku ; Ahn, Y.H. ; Park, Jiwoong
Author_Institution :
Div. of Energy Syst. Res., Ajou Univ., Suwon
Abstract :
Scanning photocurrent measurements are demonstrated in individual carbon nanotube field- effect transistors. Photocurrent images in conjunction with the electrical conductance measurement elucidate the properties of metal-CNT interfaces, especially the electron band alignment at the contact.
Keywords :
band structure; carbon nanotubes; electrical contacts; field effect transistors; interface states; photoconductivity; semiconductor nanotubes; semiconductor-metal boundaries; C; carbon nanotube field-effect transistors; electrical conductance measurement; electronic band structures; metal contacts; metal-CNT interfaces; scanning photocurrent microscopy; Atomic force microscopy; Carbon nanotubes; Contacts; Electric variables measurement; Electrodes; FETs; Laser beams; Optical microscopy; Photoconductivity; Semiconductivity;
Conference_Titel :
Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-1173-3
Electronic_ISBN :
978-1-4244-1174-0
DOI :
10.1109/CLEOPR.2007.4391716
