DocumentCode :
2251926
Title :
Crosstalk reduction using buffer insertion
Author :
Dubey, Sanjay ; Jorgenson, Joel
Author_Institution :
Sun Microsystems Inc, Sunnyvale, CA, USA
Volume :
2
fYear :
2002
fDate :
19-23 Aug. 2002
Firstpage :
639
Abstract :
Due to the rapid scaling of the CMOS process, the fringing capacitance and the coupling capacitance will play a major role in the noise analysis of the integrated circuits. Coupling induced signal integrity problems will also become more acute. Crosstalk may cause false triggering, improper logic levels, and increased delay or race conditions. In this work, the authors propose a methodology for buffer insertion to reduce on-chip coupling and to achieve timing constraints and requirements.
Keywords :
CMOS integrated circuits; VLSI; buffer circuits; capacitance; crosstalk; electromagnetic compatibility; electromagnetic interference; CMOS process scaling; EMC; EMI; buffer insertion; coupling capacitance; crosstalk reduction; delay conditions; false triggering; fringing capacitance; improper logic levels; integrated circuit noise analysis; on-chip coupling reduction; race conditions; timing constraints; timing requirements; 1f noise; Capacitance; Coupling circuits; Crosstalk; Integrated circuit interconnections; Integrated circuit noise; Routing; Very large scale integration; Voltage; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on
Conference_Location :
Minneapolis, MN, USA
Print_ISBN :
0-7803-7264-6
Type :
conf
DOI :
10.1109/ISEMC.2002.1032666
Filename :
1032666
Link To Document :
بازگشت