DocumentCode :
2251959
Title :
Electrostatic writing and imaging using a force microscope
Author :
Saurenbach, F. ; Terris, B.D.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
fYear :
1990
fDate :
7-12 Oct. 1990
Firstpage :
757
Abstract :
A modified force microscope, the electrostatic force microscope, was used to study the charging properties of a polymer surface. A polycarbonate surface was charged by placing a small voltage on a tungsten microscope tip and touching the tip to the surface. It was found that the amount of charge transferred depended on the voltage applied to the tip and on the previous contacts to the surface, but that the charge transferred was independent of the number of contacts and the contact timed. These results are compared to polymer/metal contact electrification data in the literature.<>
Keywords :
electric breakdown of solids; electric charge; electrostatic devices; electrostatics; insulation testing; microscopes; organic insulating materials; polymers; surface discharges; W; charging; contacts; electric charge; electrification; electrostatic devices; force microscope; imaging; polycarbonate; polymer surface; voltage; writing; Electrostatics; Force measurement; Microscopy; Polymers; Spatial resolution; Surface charging; Surface cleaning; Tungsten; Voltage; Writing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Society Annual Meeting, 1990., Conference Record of the 1990 IEEE
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-87942-553-9
Type :
conf
DOI :
10.1109/IAS.1990.152270
Filename :
152270
Link To Document :
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