DocumentCode :
2252583
Title :
Robustness of classical tuning correlations for proportional-integral controllers
Author :
Baab, C.T. ; Latchman, Haniph A. ; Crisalle, Oscar D.
Author_Institution :
Dept. of Chem. Eng., Florida Univ., Gainesville, FL, USA
Volume :
6
fYear :
2003
fDate :
4-6 June 2003
Firstpage :
4997
Abstract :
A formal robustness stability analysis of popular proportional-integral (PI) controller tuning rules for systems approximated by a first-order-plus-time-delay model is proposed. The uncertainty in the process model is represented by multiplicative parametric perturbations in the process gain, process time constant, and process time-delay. The zero-exclusion principle is used to characterize the robustness of the uncertain system in terms of the set of all perturbations that result in stable closed-loops. The robustness results recover the standard gain and phase margin concepts as special cases. In addition, a parametric stability margin is introduced for this class of problems as a generic metric via which alternative PI controller tuning rules may be compared in terms of robustness to simultaneous variations in the all three model parameters. The results of the paper can be applied to several disturbance-rejection and tracking PI tuning rules in widespread use, and permits comparing the tuning rules in terms of their relative robustness. It is shown for example that the integral-square-error tuning rule for disturbance rejection can be destabilized by a 7% simultaneous variation in the system parameters.
Keywords :
PI control; closed loop systems; correlation methods; delays; integral equations; stability; tuning; uncertain systems; PI controller; classical tuning correlation; disturbance-rejection; first-order-plus-time-delay model; formal robustness stability analysis; integral-square error tuning rule; multiplicative parametric perturbation; parametric stability margin; phase margin concept; process gain; process time constant; process time-delay; proportional-integral controller; stable closed-loop; system parameter; uncertain system; zero-exclusion principle; Chemical analysis; Chemical engineering; Delay effects; Error correction; Noise robustness; Pi control; Proportional control; Robust control; Robust stability; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
American Control Conference, 2003. Proceedings of the 2003
ISSN :
0743-1619
Print_ISBN :
0-7803-7896-2
Type :
conf
DOI :
10.1109/ACC.2003.1242517
Filename :
1242517
Link To Document :
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