DocumentCode :
2252849
Title :
Reduction of crosstalk noise between interconnect lines in CMOS RF integrated circuits
Author :
Ootera, H. ; Nishikawa, K. ; Yamakawa, S. ; Oomori, T. ; Tanabe, S.
Author_Institution :
Adv. Technol. R&D Center, Mitsubishi Electr. Corp., Hyogo, Japan
Volume :
2
fYear :
2002
fDate :
19-23 Aug. 2002
Firstpage :
866
Abstract :
We have numerically investigated crosstalk noise between interconnect lines in CMOS RF integrated circuits. Immersed microstrip line (IMSL) and immersed coplanar waveguide (ICPW) over Si substrate were analyzed to make clear shielding effect of grounded planes to reduce crosstalk noise between parallel interconnect lines. It was shown that the crosstalk between the interconnect lines were extensively reduced by the use of IMSLs or ICPWs, compared with simple lines. However, in layout designs using ICPWs, we need consideration about the transmission loss due to the electromagnetic coupling with the lossy Si substrate. On the other hand, for IMSL configurations, the transmission loss due to the Si substrate is small, because the ground plane shields the signal line from the electromagnetic coupling with the Si substrate.
Keywords :
CMOS integrated circuits; absorbing media; coplanar waveguides; crosstalk; electromagnetic shielding; elemental semiconductors; integrated circuit interconnections; interference suppression; losses; microstrip lines; silicon; substrates; CMOS RF integrated circuits; Si; Si substrate; crosstalk noise reduction; electromagnetic coupling; grounded planes; immersed coplanar waveguide; immersed microstrip line; interconnect lines; layout designs; lossy Si substrate; parallel interconnect lines; shielding effect; transmission loss; CMOS integrated circuits; Crosstalk; Electromagnetic coupling; Electromagnetic waveguides; Integrated circuit interconnections; Integrated circuit noise; Microstrip; Propagation losses; Radio frequency; Radiofrequency integrated circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on
Conference_Location :
Minneapolis, MN, USA
Print_ISBN :
0-7803-7264-6
Type :
conf
DOI :
10.1109/ISEMC.2002.1032710
Filename :
1032710
Link To Document :
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