DocumentCode :
2253817
Title :
Finite element analysis of novel substrate design for high performance and cost reduction stacked die CSP
Author :
Yueh, William R. ; Lee, James C C ; Wu, A.B.L. ; Chen, Jimmy C M
Author_Institution :
Meicer Semicond. Inc., Jung Li, Taiwan
fYear :
2002
fDate :
2002
Firstpage :
267
Lastpage :
273
Abstract :
Tessera μBGA is the only true CSP package that pass JEDEC level 1 qualification for high performance RAMBUS, DDR and Flash products. The Reduced Cost Chip Scale Package (RC2SP) is currently under development by Meicer with two plus metal layers thin core rigid board for large panel processing to reduce cost. Competitive cost, technology and performance are essential to cost down for μBGA. Thin core rigid board with hard spring copper instead of TAB tape would also provide better ground shielding and dimensional stability. Thermomechanical reliability study has been performed with design changes of packaging structure. This paper specifically addresses some design characteristics of reduced cost package at sufficient reliability, better thermal and electrical performance with finite element simulation validation. The two metal thin core rigid board with all the layers modeled might suffer thermal compression during copper foil etching process. Hence the need for selecting CTE and Young´s modulus of dielectric layer and changing the structure of thin core rigid board to balance the contractility of each side for ensuring the coplanarity is very important.
Keywords :
Young´s modulus; ball grid arrays; chip scale packaging; circuit stability; encapsulation; finite element analysis; integrated circuit reliability; shielding; thermal expansion; thermal resistance; CTE; DDR; Flash products; JEDEC level 1 qualification; Meicer; RAMBUS; RC2SP; Reduced Cost Chip Scale Package; Tessera μBGA; Young´s modulus; contractility; coplanarity; cost; cost reduction; design characteristics; dimensional stability; etching process; finite element analysis; finite element simulation validation; ground shielding; large panel processing; stacked die CSP; substrate design; thermal compression; thermomechanical reliability; thin core rigid board; Chip scale packaging; Copper; Costs; Etching; Finite element methods; Performance analysis; Qualifications; Springs; Stability; Thermomechanical processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 2002. IEMT 2002. 27th Annual IEEE/SEMI International
Print_ISBN :
0-7803-7301-4
Type :
conf
DOI :
10.1109/IEMT.2002.1032766
Filename :
1032766
Link To Document :
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