Title :
Inspection challenges of leadless packages
Author :
Bertz, Robert ; Leahy, Patrick
Author_Institution :
RVSI, New Berlin, WI, USA
Abstract :
The advantages of leadless devices are many, but along with the new technology come new inspection challenges. This paper explores the post-singulation inspection challenges related to the implementation of leadless packages from the perspective of a user implementing a new packaging technology, as well as that of a supplier of inspection tools working to address unique challenges inherent in the package design. Inspection challenges to be reviewed include coplanarity, pad integrity, board quality, package sides and mark inspection.
Keywords :
inspection; packaging; inspection technology; leadless package; Assembly; Costs; Inspection; Lead compounds; Manufacturing processes; Packaging machines; Performance evaluation; Semiconductor device packaging; Surface-mount technology; Testing;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 2002. IEMT 2002. 27th Annual IEEE/SEMI International
Print_ISBN :
0-7803-7301-4
DOI :
10.1109/IEMT.2002.1032792