Title :
Estimating DC power bus noise
Author :
Mao, Jingkun ; Archambeault, Bruce ; Drewniak, James L. ; Van Doren, Thomas P.
Author_Institution :
Dept. of Electron. & Comput. Eng., Missouri Univ., Rolla, MO, USA
Abstract :
Simultaneous switching noise (SSN) resulting from IC devices can result in significant power bus noise, as well as radiation problems. An approach for estimating the power bus noise spectrum is presented in this paper. The power bus noise caused by digital circuits injecting high-frequency noise onto the DC buses feeding digital devices is calculated The transient current drawn by an IC device is modeled using the load current and the shoot-through current through the power dissipation capacitance. Modeling and experimental results for several digital chips are shown. The modeling agrees well with the experimental results.
Keywords :
digital integrated circuits; electromagnetic compatibility; electromagnetic interference; power integrated circuits; switching transients; DC power bus noise estimation; EM radiation problems; EMC; EMI; IC devices; digital chips; high-frequency noise; load current; power dissipation capacitance; shoot-through current; simultaneous switching noise; transient current; Capacitance; Clocks; Frequency; Impedance; Integrated circuit noise; Power dissipation; Power system harmonics; Switches; Transient analysis; Voltage;
Conference_Titel :
Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on
Conference_Location :
Minneapolis, MN, USA
Print_ISBN :
0-7803-7264-6
DOI :
10.1109/ISEMC.2002.1032838
