Title :
A few deg/hr resolvable low noise lateral microgyroscope
Author :
Hyung-Taek Lim ; Jin-Woo Song ; Jang-Gyu Lee ; Yong-Kweon Kim
Author_Institution :
Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
Abstract :
A 4.68/spl deg//hr equivalent noise level microgyroscope is fabricated and tested with a conventional electronic circuits on a PCB (printed circuit board). The rate resolution is improved by reduced noise with field coupling compensation and a large oscillation amplitude of the driven mode. The unbalanced capacitance variation due to the fringing field is compensated with a mirrored anchor structure. The driven oscillation with enhanced amplitude is mechanically decoupled using a folded spring structure, which is independent of the oscillation of the sensed mode. The sensing electronic circuit is realized on a PCB using a DIP IC, and capacitance variation in the atto-farad range is shown through driven and sensed mode measurement. The fabricated gyroscope was tested by applying 0.01/spl deg//sec amplitude with 1 Hz sinusoidal input, and showed an equivalent noise level of 4.68/spl deg//hr (0.0013/spl deg//sec). The microgyroscope is characterized by a linearity error of less than 0.8% FSO for a measured range of /spl plusmn/200/spl deg//sec.
Keywords :
gyroscopes; micromechanical resonators; microsensors; printed circuits; semiconductor device noise; semiconductor device testing; DIP IC; attofarad range; driven mode oscillation amplitude; field coupling compensation; folded spring structure; fringing field; lateral microgyroscope; linearity error; low equivalent noise level; mirrored anchor structure; polysilicon micromachining; printed circuit board; rate resolution; reduced noise; resonant mode measurement; sensed mode oscillation; sensing electronic circuit; sinusoidal input; unbalanced capacitance variation; Capacitance; Circuit noise; Circuit testing; Coupling circuits; Electronic circuits; Electronic equipment testing; Noise level; Noise reduction; Printed circuits; Springs;
Conference_Titel :
Micro Electro Mechanical Systems, 2002. The Fifteenth IEEE International Conference on
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-7803-7185-2
DOI :
10.1109/MEMSYS.2002.984349