• DocumentCode
    2255151
  • Title

    Survivability analysis of network specifications

  • Author

    Jha, S. ; Wing, J. ; Linger, R. ; Longstaff, T.

  • Author_Institution
    Dept. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    613
  • Lastpage
    622
  • Abstract
    Survivability is the ability of a system to maintain a set of essential services despite the presence of abnormal events, such as faults and intrusions. Ensuring system survivability has increased in importance as critical infrastructures have become heavily dependent on computers. In this paper, we present a systematic method for performing survivability analysis of networks. A system architect injects fault and intrusion events into a given specification of a network and then visualizes the effects of the injected events in the form of scenario graphs. In our method, we automatically generate scenario graphs using model checking. Out method enables further global analysis, such as reliability analysis, where mathematical techniques used in different domains are combined in a systematic manner. We illustrate our ideas on an abstract model of the United States Payment System
  • Keywords
    bank data processing; cheque processing; computer network reliability; data visualisation; formal specification; graphs; telecommunication computing; United States Payment System; abnormal events; cheque clearance system; computer-dependent critical infrastructures; essential service maintenance; fault events; fault injection; global analysis; intrusion events; model checking; network specifications; reliability analysis; scenario graphs; survivability analysis; Automation; Electrical capacitance tomography; Fault tolerance; Finance; Government; Military computing; Performance analysis; Power system modeling; Telecommunication computing; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Systems and Networks, 2000. DSN 2000. Proceedings International Conference on
  • Conference_Location
    New York, NY
  • Print_ISBN
    0-7695-0707-7
  • Type

    conf

  • DOI
    10.1109/ICDSN.2000.857597
  • Filename
    857597