DocumentCode :
2255640
Title :
Environmental impact and design parameters in electronics manufacturing-a sensitivity analysis approach
Author :
Siddhaye, Sudarshan ; Sheng, Paul
Author_Institution :
Dept. of Mech. Eng., California Univ., Berkeley, CA, USA
fYear :
2000
fDate :
2000
Firstpage :
39
Lastpage :
45
Abstract :
Environmental factors have become an increasingly important issue in the design of electronic products. Factors such as recyclability and product end-of-life, latent human hazards and physical hazards have migrated from secondary constraints to become integral design objectives. However the extent to which design levers can be used to meet these objectives is often unknown, since there can be many interactions taking place during the design process. One method for determining environmental sensitivity is through a multi-layered influence diagram, which maps the influence of primary design parameters to product characteristic variables, waste variables and hazard variables. The influence diagram framework is coupled with process relationships between layers and variable space constraints to form a sensitivity analysis. This approach has been shown to be effective in conveying hazard relationships to key assembly design parameters. A case example of design sensitivity to waste variables for printed circuit board assembly (PCBA) is presented
Keywords :
assembling; design for environment; printed circuit manufacture; product development; sensitivity analysis; design parameters; electronic products design; electronics manufacturing; environmental impact; latent human hazards; multi-layered influence diagram; physical hazards; primary design parameters; printed circuit board assembly; product end-of-life; recyclability; sensitivity analysis; waste variables; Assembly; Environmental factors; Hazards; Humans; Manufacturing; Mechanical engineering; Process design; Product design; Sensitivity analysis; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics and the Environment, 2000. ISEE 2000. Proceedings of the 2000 IEEE International Symposium on
Conference_Location :
San Francisco, CA
ISSN :
1095-2020
Print_ISBN :
0-7803-5962-3
Type :
conf
DOI :
10.1109/ISEE.2000.857623
Filename :
857623
Link To Document :
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