On reset based functional broadside tests

Functional broadside tests were defined to avoid overtesting that may occur under structural scan-based tests. Overtesting occurs due to non-functional operation conditions created by unreachable scan-in states. Functional broadside tests were computed assuming that functional operation starts after the circuit is synchronized. We discuss the definition of functional broadside tests for the case where hardware reset is used for bringing the circuit into a known state before functional operation starts. We show that the set of reachable states for a circuit with hardware reset contains the set of reachable states based on a synchronizing sequence. Consequently, the set of functional broadside tests and the set of detectable faults for a circuit with hardware reset contain those obtained based on a synchronizing sequence. In addition, there are differences between different reset states in the sets of reachable states and the sets of detectable faults.