DocumentCode :
2257100
Title :
Integrated charge-pump phase-locked loop with SC-loop filter for capacitive microsensor readout
Author :
Speeti, Timo ; Aaltonen, Lasse ; Halonen, Kari
Author_Institution :
Electron. Circuit Design Lab., Helsinki Univ. of Technol., Espoo, Finland
fYear :
2009
fDate :
24-27 May 2009
Firstpage :
1373
Lastpage :
1376
Abstract :
In this paper, simulated and measured phase noise characteristics for a charge-pump phase-locked loop (PLL) with a switched capacitor loop filter are presented. The PLL is fabricated using a 0.35 mum high-voltage CMOS technology. The PLL is designed for a reference frequency range from 3 kHz to 10 kHz, for divider value of 32, and to operate in temperature range from 40degC to +85degC and with 2.5 to 3.6 V supply. Measured results indicate that the SC-filter can be used to replace the conventional RC-filter in order to reduce area.
Keywords :
CMOS integrated circuits; RC circuits; charge pump circuits; microsensors; phase locked loops; phase noise; switched capacitor filters; capacitive microsensor readout; conventional RC-filter; frequency 3 kHz to 10 kHz; high-voltage CMOS technology; integrated charge-pump phase-locked loop; phase noise; size 0.35 mum; switched capacitor loop filter; temperature 40 degC to 85 degC; voltage 2.5 V to 3.6 V; CMOS technology; Capacitors; Charge pumps; Current measurement; Filters; Microsensors; Noise measurement; Phase locked loops; Phase measurement; Phase noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-3827-3
Electronic_ISBN :
978-1-4244-3828-0
Type :
conf
DOI :
10.1109/ISCAS.2009.5118020
Filename :
5118020
Link To Document :
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