Title :
Interference pattern formation in the second-order intensity correlation with beams orthogonally polarized
Author :
Vidal, I. ; Caetano, D.P. ; Olindo, C. ; Fonseca, E.J.S. ; Hickmann, J.M.
Author_Institution :
Inst. de Fis., Univ. Fed. de Alagoas, Maceio
Abstract :
Considering the polarization state of the pseudothermal light beams, we demonstrate that the nonlocal second-order interference pattern formation does not depend on the polarization of the beams crossing the different parts of a distributed double-slit.
Keywords :
light interference; light polarisation; optical correlation; pattern formation; distributed double-slit; nonlocal second-order interference pattern formation; polarization; pseudothermal light beams; second-order intensity correlation; Heterojunction bipolar transistors; Interference; Light sources; Optical imaging; Optical polarization; Optical recording; Optical retarders; Pattern formation; Quantum mechanics; Testing; (110.1650) Coherence imaging; (270.1670) Coherent optical effects;
Conference_Titel :
Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-859-9
