Title :
On-chip PVT compensation techniques for low-voltage CMOS digital LSIs
Author :
Tsugita, Yusuke ; Ueno, Ken ; Asai, Tetsuya ; Amemiya, Yoshihito ; Hirose, Tetsuya
Author_Institution :
Dept. of Electr. Eng., Hokkaido Univ., Sapporo, Japan
Abstract :
An on-chip process, supply voltage, and temperature (PVT) compensation technique for a low-voltage CMOS digital circuit is proposed. Because the degradation of circuit performance originates from the variation of the saturation current, a compensation technique that uses a reference current that is independent of PVT variations was developed. The operations of the circuit were confirmed by SPICE simulation with a set of 0.35-mum standard CMOS parameters. Moreover, Monte Carlo simulations assuming process spread and device mismatch in all MOSFETs showed the effectiveness of the proposed technique and achieved performance improvement of 74%. The circuit is useful for on-chip compensation to mitigate the degradation of circuit performance with PVT variation in low-voltage digital circuits.
Keywords :
CMOS digital integrated circuits; MOSFET; Monte Carlo methods; large scale integration; low-power electronics; MOSFET; Monte Carlo simulations; circuit performance degradation; low-voltage CMOS digital circuit; onchip compensation; onchip process; supply voltage; temperature compensation; CMOS digital integrated circuits; CMOS process; CMOS technology; Circuit optimization; Circuit simulation; Degradation; Digital circuits; SPICE; Temperature; Voltage;
Conference_Titel :
Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-3827-3
Electronic_ISBN :
978-1-4244-3828-0
DOI :
10.1109/ISCAS.2009.5118068