Title :
Analysis of the impact of gate-body signal phase on DTMOS inverters in 0.13 μm PD-SOI
Author :
Drake, Alan J. ; Zamdmer, Noah ; Nowka, Kevin J. ; Brown, Richard B.
Author_Institution :
Dept. of EECS, Michigan Univ., Ann Arbor, MI, USA
fDate :
29 Sept.-2 Oct. 2003
Abstract :
In this paper, we analysis the impact of gate-body signal phase on DTMOS inverters in 0.13μm PD-SOI.
Keywords :
MOSFET; integrated circuit modelling; invertors; logic gates; silicon-on-insulator; 0.13 micron; DTMOS inverters; PD-SOI; dynamic threshold transistors; gate body signal phase; Integrated circuit modeling; Inverters; MOSFETs; Silicon on insulator technology;
Conference_Titel :
SOI Conference, 2003. IEEE International
Print_ISBN :
0-7803-7815-6
DOI :
10.1109/SOI.2003.1242914
