DocumentCode
2259012
Title
A systematic approach to the test of combined HW/SW systems
Author
Krupp, Alexander ; Müller, Wolfgang
Author_Institution
C-Lab., Paderborn Univ., Paderborn, Germany
fYear
2010
fDate
8-12 March 2010
Firstpage
323
Lastpage
326
Abstract
Today we can identify a big gap between requirement specification and the generation of test environments. This article extends the Classification Tree Method for Embedded Systems (CTM/ES) to fill this gap by new concepts for the precise specification of stimuli for operational ranges of continuous control systems. It introduces novel means for continuous acceptance criteria definition and for functional coverage definition.
Keywords
embedded systems; formal specification; hardware-software codesign; integrated circuit testing; HW/SW systems; classification tree method; continuous acceptance criteria; continuous control systems; embedded systems; functional coverage definition; requirement specification; systematic approach; test environment; Automatic testing; Automotive engineering; Classification tree analysis; Control systems; Electronic equipment testing; Embedded system; Mathematical model; Object oriented modeling; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location
Dresden
ISSN
1530-1591
Print_ISBN
978-1-4244-7054-9
Type
conf
DOI
10.1109/DATE.2010.5457186
Filename
5457186
Link To Document