Title :
Impact of self-heating on digital SOI and strained-silicon CMOS circuits
Author :
Jenkins, K.A. ; Franch, R.L.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fDate :
29 Sept.-2 Oct. 2003
Abstract :
In this paper, we describe the worst-case drain current reduction due to self-heating in digital SOI CMOS circuits.
Keywords :
CMOS digital integrated circuits; elemental semiconductors; integrated circuit modelling; silicon; silicon-on-insulator; Si; digital SOI; drain current reduction; self heating; strained silicon CMOS circuit; CMOS digital integrated circuits; Integrated circuit modeling; Silicon; Silicon on insulator technology;
Conference_Titel :
SOI Conference, 2003. IEEE International
Print_ISBN :
0-7803-7815-6
DOI :
10.1109/SOI.2003.1242936
