Title :
Pseudo-CMOS: A novel design style for flexible electronics
Author :
Huang, Tsung-Ching ; Fukuda, Kenjiro ; Lo, Chun-Ming ; Yeh, Yung-Hui ; Sekitani, Tsuyoshi ; Someya, Takao ; Cheng, Kwang-Ting
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California at Santa Barbara, Santa Barbara, CA, USA
Abstract :
Flexible electronics have attracted much attention since they enable promising applications such as low-cost RFID tags and e-paper. Thin-film transistors (TFTs) are considered as an ideal candidate to implement flexible electronics on low-cost substrates. Most TFT technologies, however, have only mono-type - either n- or p-type - devices and thus modern design technologies for silicon-based electronics cannot be directly applied. In this paper, we propose a novel design style Pseudo-CMOS for flexible electronics that uses only mono-type TFTs while achieving comparable performance with the complementary-type designs. The manufacturing cost and complexity can therefore be significantly reduced while the circuit yield and reliability are also enhanced with the built-in capability of post-fabrication tuning. Some standard cells have been designed and fabricated in p-type organic and n-type InGaZnO (IGZO) TFT technologies which successfully verify the superiority of the proposed Pseudo-CMOS design style. To the best of our knowledge, this is the first design solution that has proven superior performance for both types of TFT technologies.
Keywords :
CMOS integrated circuits; flexible electronics; indium compounds; integrated circuit design; integrated circuit reliability; integrated circuit yield; organic semiconductors; thin film circuits; thin film transistors; InGaZnO; circuit reliability; circuit yield; flexible electronic design style; mono type thin film transistors; organic TFT; post fabrication tuning; pseudo CMOS; standard cell; Circuit optimization; Flexible electronics; Manufacturing; Organic thin film transistors; Plastics; RFID tags; Silicon; Substrates; Thermal degradation; Thin film transistors;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
Print_ISBN :
978-1-4244-7054-9
DOI :
10.1109/DATE.2010.5457220