• DocumentCode
    2259986
  • Title

    Large margin classifier via semiparametric inference

  • Author

    Tsuda, Koji ; Akaho, Shotaro

  • Author_Institution
    Electrotech. Lab., Ibaraki, Japan
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    23
  • Abstract
    In this paper, we construct a learning method of stochastic perceptron based on semiparametric inference, and show that this method produces large margin solutions. In semiparametric inference, the parameters are divided into structural parameters which are to be estimated and nuisance parameters in which we do not have any interest. Here, the weight vector of perceptron is defined as structural parameters and the steepness of transfer function is defined as a nuisance parameter. Usually, rough estimate is substituted to nuisance parameters and only structural parameters are estimated. To compensate the estimation error caused by rough estimate, an additional term is added to the derivative of likelihood. We will show that this additional term is related to the regularization term which causes large margin solutions. This work suggests that the success of large margin classifiers can be attributed to semiparametric inference
  • Keywords
    inference mechanisms; learning (artificial intelligence); parameter estimation; pattern classification; perceptrons; stochastic processes; transfer functions; estimation error compensation; large margin classifier; learning; nuisance parameters; rough estimate; semiparametric inference; stochastic perceptron; structural parameter estimation; transfer function steepness; Bayesian methods; Laboratories; Learning systems; Parameter estimation; Robustness; Stochastic processes; Structural engineering; Support vector machine classification; Support vector machines; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 2000. IJCNN 2000, Proceedings of the IEEE-INNS-ENNS International Joint Conference on
  • Conference_Location
    Como
  • ISSN
    1098-7576
  • Print_ISBN
    0-7695-0619-4
  • Type

    conf

  • DOI
    10.1109/IJCNN.2000.857869
  • Filename
    857869