DocumentCode
2260239
Title
AgeSim: A simulation framework for evaluating the lifetime reliability of processor-based SoCs
Author
Huang, Lin ; Xu, Qiang
Author_Institution
Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Shatin, China
fYear
2010
fDate
8-12 March 2010
Firstpage
51
Lastpage
56
Abstract
Aggressive technology scaling has an ever-increasing adverse impact on the lifetime reliability of microprocessors. This paper proposes a novel simulation framework for evaluating the lifetime reliability of processor-based system-on-a-chips (SoCs), namely AgeSim, which facilitates designers to make design decisions that affect SoCs´ mean time to failure. Unlike existing work, AgeSim can simulate failure mechanisms with arbitrary lifetime distributions and do not require to trace the system´s reliability-related factors over its entire lifetime, and hence is more efficient and accurate. Two case studies are conducted to show the flexibility and effectiveness of the proposed methodology.
Keywords
circuit reliability; logic design; system-on-chip; AgeSim; aggressive technology scaling; failure mechanism; lifetime reliability; processor-based SoC; simulation framework; system-on-a-chip; Aging; Circuit simulation; Computational modeling; Failure analysis; Power system reliability; Redundancy; System-on-a-chip; Temperature dependence; Thermal management; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location
Dresden
ISSN
1530-1591
Print_ISBN
978-1-4244-7054-9
Type
conf
DOI
10.1109/DATE.2010.5457238
Filename
5457238
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