• DocumentCode
    2260239
  • Title

    AgeSim: A simulation framework for evaluating the lifetime reliability of processor-based SoCs

  • Author

    Huang, Lin ; Xu, Qiang

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Shatin, China
  • fYear
    2010
  • fDate
    8-12 March 2010
  • Firstpage
    51
  • Lastpage
    56
  • Abstract
    Aggressive technology scaling has an ever-increasing adverse impact on the lifetime reliability of microprocessors. This paper proposes a novel simulation framework for evaluating the lifetime reliability of processor-based system-on-a-chips (SoCs), namely AgeSim, which facilitates designers to make design decisions that affect SoCs´ mean time to failure. Unlike existing work, AgeSim can simulate failure mechanisms with arbitrary lifetime distributions and do not require to trace the system´s reliability-related factors over its entire lifetime, and hence is more efficient and accurate. Two case studies are conducted to show the flexibility and effectiveness of the proposed methodology.
  • Keywords
    circuit reliability; logic design; system-on-chip; AgeSim; aggressive technology scaling; failure mechanism; lifetime reliability; processor-based SoC; simulation framework; system-on-a-chip; Aging; Circuit simulation; Computational modeling; Failure analysis; Power system reliability; Redundancy; System-on-a-chip; Temperature dependence; Thermal management; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4244-7054-9
  • Type

    conf

  • DOI
    10.1109/DATE.2010.5457238
  • Filename
    5457238