• DocumentCode
    2260265
  • Title

    Discrete Bayesian-Based Scheme of Software Reliability Demonstration Testing with Decreasing Function for the Safety Critical Software

  • Author

    Xuecheng, Wang ; Risheng, Yang ; Minyan, Lu ; Haifeng, Li

  • Author_Institution
    Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
  • fYear
    2010
  • fDate
    11-14 Dec. 2010
  • Firstpage
    591
  • Lastpage
    595
  • Abstract
    The Bayesian-based scheme of software reliability demonstration testing (SRDT) is suitable for the safety-critical software (SCS) for it can utilize the prior information to significantly decreasing the required testing effort of SRDT. Selecting the appropriate prior distribution of the failure probability is very significant to the discrete Bayesian-based scheme of SRDT. Utilizing the decreasing function for constructing the prior distribution is a new and effective approach for Bayesian theory. Thus this paper uses the decreasing function of the failure probability as its prior distribution and then proposes a new Bayesian-based scheme with prior information based on decreasing function (DFBSRDT). Using three failure data-sets as the prior information, we compare the proposed DFBSRDT with two existing Bayesian-based schemes, i.e. the Bayesian-based schemes without prior information (BSRDT) and with prior information (PIBSRDT). The results show that the proposed DFBSRDT is more effective and applicable than BSRDT and PIBSRDT for significantly decreasing the required testing effort of SRDT for SCS especially the SCS with high reliability.
  • Keywords
    Bayes methods; program testing; safety-critical software; system recovery; Bayesian-based scheme; failure probability; safety critical software; software reliability demonstration testing; Bayesian; Decreasing function; Safety-Critical software; Software reliability demonstration testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Intelligence and Security (CIS), 2010 International Conference on
  • Conference_Location
    Nanning
  • Print_ISBN
    978-1-4244-9114-8
  • Electronic_ISBN
    978-0-7695-4297-3
  • Type

    conf

  • DOI
    10.1109/CIS.2010.135
  • Filename
    5696351