• DocumentCode
    2260874
  • Title

    Final value of aliasing error probability for transition counting

  • Author

    Seireg, Reda H. ; Vacroux, André G.

  • Author_Institution
    Mil. Tech. Coll., Cairo, Egypt
  • fYear
    1993
  • fDate
    16-18 Aug 1993
  • Firstpage
    682
  • Abstract
    The Aliasing Error Probability (AEP) is the most important parameter for evaluation of any compaction method. The general formula for AEP was deduced for the transition counting technique under the assumption that the input sequence is equally likely. In this paper Markov processes are used to calculate the Final Value of AEP (FV-AEP) for the Transition Counting (TC) technique. A general formula is deduced which depends on the counter module. The new equation allows a comparison between the TC technique and the linear technique
  • Keywords
    Markov processes; circuit testing; error statistics; probability; Markov processes; aliasing error probability; compaction method; counter module; transition counting; Circuit faults; Circuit testing; Cities and towns; Clocks; Compaction; Counting circuits; Educational institutions; Equations; Error probability; Markov processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1993., Proceedings of the 36th Midwest Symposium on
  • Conference_Location
    Detroit, MI
  • Print_ISBN
    0-7803-1760-2
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1993.342955
  • Filename
    342955