Title :
Optical forces in scanning probe microscopy
Author :
Kohlgraf-Owens, Dana C. ; Sukhov, Sergey ; Dogariu, Aristide
Author_Institution :
Coll. of Opt. & Photonics, Univ. of Central Florida, Orlando, FL, USA
Abstract :
We demonstrate that the mechanical action of light can be detected by a scanning probe microscope. The conservative and nonconservative electromagnetic forces can be directly measured and they affect the perceived topography.
Keywords :
electromagnetic forces; near-field scanning optical microscopy; optical fibre testing; surface topography; conservative electromagnetic forces; mechanical action; nonconservative electromagnetic forces; optical forces; scanning probe microscopy; topography; Force; Optical fiber sensors; Optical fibers; Optical scattering; Optical variables measurement; Probes;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2011 Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4577-1223-4
