DocumentCode :
2261499
Title :
IDDQ test method based on wavelet transformation for noisy current measurement environment
Author :
Hashizume, Masaki ; Yoneda, Daisuke ; Yotsuyanagi, Hiroyuki ; Tada, Tetsuo ; Koyama, Takeshi ; Morita, Ikuro ; Tamesada, Takeomi
Author_Institution :
Tokushima Univ., Japan
fYear :
2004
fDate :
15-17 Nov. 2004
Firstpage :
112
Lastpage :
117
Abstract :
An IDDQ test method is proposed in this paper, which is applicable even if supply current measurement is impaired by noise. Wavelet transformation is used for noise elimination in the test method. In this paper, it is shown by some experiments that bridging faults will be detected by using the proposed test method. Since expert knowledge on filter design is not needed in noise elimination of the IDDQ test method, it is expected that the test method will be used in many IDDQ tests.
Keywords :
CMOS integrated circuits; circuit noise; circuit testing; electric current measurement; fault location; integrated logic circuits; logic testing; wavelet transforms; IDDQ test method; bridging fault detection; noise elimination; noisy current measurement environment; supply current measurement; wavelet transformation; CMOS logic circuits; Circuit faults; Circuit testing; Current measurement; Current supplies; Fault detection; Integrated circuit noise; Logic testing; Noise measurement; Working environment noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2004. 13th Asian
ISSN :
1081-7735
Print_ISBN :
0-7695-2235-1
Type :
conf
DOI :
10.1109/ATS.2004.50
Filename :
1376545
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2261499
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