DocumentCode :
2262639
Title :
ATML demonstration
Author :
Gorringe, Chris ; Neag, Ion A. ; Taylor, Ron
Author_Institution :
EADS Test Eng. Services (UK) Ltd., Wimborne, UK
fYear :
2009
fDate :
14-17 Sept. 2009
Firstpage :
322
Lastpage :
327
Abstract :
With the many successes and benefits realized through the ATML Phase I Demo, the demo team has decided to embark on a second phase of the ATML Demo to further advance the ATML standards and to show further applications of these standards to solve real world problems. The purpose of the demonstrations is to validate the performance of the collection of ATML standards while providing key evidence showing how the ATML family of standards can advance industry and DoD objectives. The demonstration provides detailed implementations of the standards which reveal areas where enhancements could be made to the standards to facilitate their adoption on actual programs. One of the remaining key challenges is how to further advance the ATML standards for practical use, the goal being for ATML standards to be used and provide benefits to current and future programs. Paramount to achieving this is having software tools that create and consume ATML information to tackle real problems associated with today´s working practices. The six specific demonstration areas that will be included in Phase II are: (1) test diagram generation, (2) ATML Test Description supporting TPS life cycle, (3) modular ATML Instrument Description within an ATML Test Station description, (4) Use of Test Configuration at test station runtime, (5) Interfacing with Test Results archiving databases, and (6) ATML support for digital and bus testing.
Keywords :
XML; automatic test equipment; automatic test software; military systems; ATML Phase I Demo; ATML information; ATML standards; ATML test description; ATML test station description; DoD objectives; TPS life cycle; XML interchange format; automatic test markup language; bus testing; digital testing; modular ATML instrument description; test configuration; test diagram generation; test station runtime; Databases; Instruments; Life testing; Runtime; Software standards; Software testing; Software tools; Standards development; System testing; XML; ATML; IEEE Std 1636.1.; IEEE Std 1641; IEEE Std 1671; Instrument Description; Signal Modeling; Test Adaptor Description; Test Configuration; Test Description; Test Results; Test Station Description; UUT Description;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2009 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
978-1-4244-4980-4
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2009.5314020
Filename :
5314020
Link To Document :
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