Title :
Flip-chip optical transceivers, monolithic pin receivers and quadratic-phase voltage-controlled oscillators in ultra-thin silicon-on-sapphire
Author :
Liping Zhang ; Sunkwang Hong ; Sawchuk, A.A.
Author_Institution :
Signal & Image Process. Inst., Univ. of Southern California, Los Angeles, CA, USA
Abstract :
Summary form only given. The ultra-thin silicon-on-sapphire process uses 100 nm silicon on top of fully insulating, optically transparent synthetic sapphire. The process has good thermal conductivity properties and thermal expansion coefficients well-matched to flip-chip-bonded GaAs optical devices. It is one example of a silicon-on-sapphire CMOS process with great potential for photonic integration. We present the design, simulation, fabrication and test of UTSi chips containing several test circuits and subsystems useful for optical communications and interconnections.
Keywords :
CMOS integrated circuits; flip-chip devices; integrated circuit testing; integrated optoelectronics; optical design techniques; optical fabrication; optical interconnections; optical receivers; optical testing; optical transmitters; p-i-n photodiodes; sapphire; silicon; silicon-on-insulator; thermal conductivity; transceivers; 100 nm; GaAs; Si-Al/sub 2/O/sub 3/; UTSi chips; flip-chip optical transceivers; flip-chip-bonded GaAs optical devices; good thermal conductivity properties; interconnections; monolithic pin receivers; optical communications; optical design; optical fabrication; optical testing; optically transparent synthetic sapphire; quadratic-phase voltage-controlled oscillators; simulation; test circuits; thermal expansion coefficients; ultra-thin silicon-on-sapphire; Circuit testing; Gallium arsenide; Insulation; Optical devices; Optical receivers; Silicon; Thermal conductivity; Thermal expansion; Transceivers; Voltage-controlled oscillators;
Conference_Titel :
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-706-7
DOI :
10.1109/CLEO.2002.1033561