Title :
Soft error rates in deep-submicron CMOS technologies
Author_Institution :
Philips Res. Labs., Eindhoven
Abstract :
With ongoing technology scaling, reliability is becoming increasingly important for integrated circuits (ICs) manufactured in deep-submicron CMOS technologies. The reliability issue that generally leads to the highest failure rates is that of radiation-induced soft errors. Both alpha particles, emitted by chip and package materials and cosmic neutrons are capable of inducing bit errors in ICs. These are named "soft errors" because the data is corrupted but the device itself is not damaged
Keywords :
CMOS integrated circuits; alpha-particles; error statistics; integrated circuit reliability; CMOS integrated circuit; alpha particles; bit errors; chip materials; cosmic neutrons; data corruption; deep-submicron CMOS technologies; integrated circuits reliability; package materials; radiation-induced soft errors; soft error rates; technology scaling; Alpha particles; CMOS technology; Error analysis; Error correction codes; Integrated circuit reliability; Integrated circuit technology; Logic; Packaging; Random access memory; Voltage;
Conference_Titel :
On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International
Conference_Location :
Lake Como
Print_ISBN :
0-7695-2620-9
DOI :
10.1109/IOLTS.2006.57
