DocumentCode
226452
Title
Two lattice metrics dendritic computing for pattern recognition
Author
Ritter, Gerhard X. ; Urcid, Gonzalo ; Valdiviezo-N, Juan-Carlos
Author_Institution
CISE Dept., Univ. of Florida, Gainesville, FL, USA
fYear
2014
fDate
6-11 July 2014
Firstpage
45
Lastpage
52
Abstract
An artificial neural network model based on dendritic computation using two lattice metrics is introduced in this paper. A description of the mathematical framework of the proposed model is provided and its corresponding learning algorithm is presented in mathematical pseudocode. Computational experiments are given to demonstrate the effectiveness and performance of the learning algorithm as well as its application to some illustrative pattern recognition problems.
Keywords
learning (artificial intelligence); neural nets; pattern recognition; artificial neural network model; computational experiments; dendritic computing; lattice metrics; learning algorithm; mathematical pseudocode; pattern recognition problems; Computational modeling; Lattices; Mathematical model; Measurement; Neurons; Training; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Fuzzy Systems (FUZZ-IEEE), 2014 IEEE International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4799-2073-0
Type
conf
DOI
10.1109/FUZZ-IEEE.2014.6891551
Filename
6891551
Link To Document