Title :
The application of computer-aided sensitivity analysis to a parallel resonant transistor microwave oscillator circuit
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
Abstract :
A methodology which allows one to perform sensitivity analysis on a given oscillator circuit prior to its construction is described. The method uses a computer program developed to obtain the solution of the oscillation equations, and commercially available curve-fitting routine. Classical sensitivity analysis methods are applied to obtain the first order and multi-parameter sensitivities of the embedding elements with respect to the variations of the s-parameters of the active device. The results of the sensitivity computations applied to a parallel resonant microwave oscillator circuit are presented
Keywords :
S-parameters; circuit analysis computing; circuit resonance; curve fitting; microstrip circuits; microwave circuits; microwave oscillators; sensitivity analysis; active device; computer-aided sensitivity analysis; curve-fitting routine; embedding elements; microwave oscillator circuit; multi-parameter sensitivities; oscillation equations; parallel resonant transistor oscillator; s-parameters; Application software; Circuits; Computer applications; Concurrent computing; Curve fitting; Equations; Oscillators; Resonance; Scattering parameters; Sensitivity analysis;
Conference_Titel :
Circuits and Systems, 1993., Proceedings of the 36th Midwest Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
0-7803-1760-2
DOI :
10.1109/MWSCAS.1993.343190
