DocumentCode
2265010
Title
Parametric mismatch characterization for mixed-signal technologies
Author
Tuinhout, Hans ; Wils, Nicole
Author_Institution
NXP Semicond., Eindhoven, Netherlands
fYear
2009
fDate
12-14 Oct. 2009
Firstpage
107
Lastpage
114
Abstract
Systematic and random parametric mismatches are major performance limiters as well as notorious causes for re-designs of high precision mixed-signal circuits and systems. Therefore it is extremely important to measure, analyze, interpret, model and document parametric mismatch mechanisms. This paper provides an overview of the main requirements and techniques for mismatch characterization of active and passive IC devices in mixed-signal technologies.
Keywords
mixed analogue-digital integrated circuits; IC devices; mixed-signal circuits; mixed-signal technologies; parametric mismatch characterization; Capacitors; Circuit synthesis; Circuit testing; Fluctuations; Integrated circuit measurements; Integrated circuit technology; Logic testing; Microscopy; Signal processing; Surfaces; Silicon device characterization; device modeling; matching; mismatch; random parametric mismatch fluctuations; systematic mismatch;
fLanguage
English
Publisher
ieee
Conference_Titel
Bipolar/BiCMOS Circuits and Technology Meeting, 2009. BCTM 2009. IEEE
Conference_Location
Capri
ISSN
1088-9299
Print_ISBN
978-1-4244-4894-4
Electronic_ISBN
1088-9299
Type
conf
DOI
10.1109/BIPOL.2009.5314132
Filename
5314132
Link To Document