DocumentCode
2265202
Title
A novel superjunction collector design for improving breakdown voltage in high-speed SiGe HBTs
Author
Yuan, Jiahui ; Cressler, John D.
Author_Institution
Sch. of ECE, Georgia Tech, Atlanta, GA, USA
fYear
2009
fDate
12-14 Oct. 2009
Firstpage
75
Lastpage
78
Abstract
We present a novel collector design for silicon-germanium heterojunction bipolar transistors (SiGe HBTs). The design improves the well-known speed / breakdown voltage trade-off in SiGe HBTs for radio-frequency (RF) and millimeter-wave applications. Applying multiple alternating p and n-type layers (a superjunction) deep in the collector-base (CB) space charge region (SCR) alters the electric field and electron temperature in the CB junction. Consequently impact ionization is suppressed while the width of CB SCR is not increased, and therefore, the breakdown voltages (BVCEO and BVCBO) are increased with no degradation in the device speed and RF or mm-wave performance. For a fixed ac performance, the BVCEO is improved by 0.33 V, producing a SiGe HBT with fT = 101 GHz, fmax = 351 GHz, and BVCEO = 3.0 V in DESSIS TCAD simulations. The proposed structure is also contrasted with other approaches in the literature.
Keywords
Ge-Si alloys; heterojunction bipolar transistors; millimetre wave devices; semiconductor device breakdown; space charge; DESSIS TCAD; SiGe; breakdown voltage; electric field; electron temperature; frequency 101 GHz to 351 GHz; heterojunction bipolar transistor; high speed SiGe HBT; millimeter wave application; radio frequency application; superjunction collector design; voltage 3 V; Electrons; Germanium silicon alloys; Heterojunction bipolar transistors; Impact ionization; Millimeter wave transistors; Radio frequency; Silicon germanium; Space charge; Temperature; Thyristors; SiGe HBT; Silicon-germanium; heterojunction bipolar transistor; superjunction;
fLanguage
English
Publisher
ieee
Conference_Titel
Bipolar/BiCMOS Circuits and Technology Meeting, 2009. BCTM 2009. IEEE
Conference_Location
Capri
ISSN
1088-9299
Print_ISBN
978-1-4244-4894-4
Electronic_ISBN
1088-9299
Type
conf
DOI
10.1109/BIPOL.2009.5314140
Filename
5314140
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