• DocumentCode
    2265202
  • Title

    A novel superjunction collector design for improving breakdown voltage in high-speed SiGe HBTs

  • Author

    Yuan, Jiahui ; Cressler, John D.

  • Author_Institution
    Sch. of ECE, Georgia Tech, Atlanta, GA, USA
  • fYear
    2009
  • fDate
    12-14 Oct. 2009
  • Firstpage
    75
  • Lastpage
    78
  • Abstract
    We present a novel collector design for silicon-germanium heterojunction bipolar transistors (SiGe HBTs). The design improves the well-known speed / breakdown voltage trade-off in SiGe HBTs for radio-frequency (RF) and millimeter-wave applications. Applying multiple alternating p and n-type layers (a superjunction) deep in the collector-base (CB) space charge region (SCR) alters the electric field and electron temperature in the CB junction. Consequently impact ionization is suppressed while the width of CB SCR is not increased, and therefore, the breakdown voltages (BVCEO and BVCBO) are increased with no degradation in the device speed and RF or mm-wave performance. For a fixed ac performance, the BVCEO is improved by 0.33 V, producing a SiGe HBT with fT = 101 GHz, fmax = 351 GHz, and BVCEO = 3.0 V in DESSIS TCAD simulations. The proposed structure is also contrasted with other approaches in the literature.
  • Keywords
    Ge-Si alloys; heterojunction bipolar transistors; millimetre wave devices; semiconductor device breakdown; space charge; DESSIS TCAD; SiGe; breakdown voltage; electric field; electron temperature; frequency 101 GHz to 351 GHz; heterojunction bipolar transistor; high speed SiGe HBT; millimeter wave application; radio frequency application; superjunction collector design; voltage 3 V; Electrons; Germanium silicon alloys; Heterojunction bipolar transistors; Impact ionization; Millimeter wave transistors; Radio frequency; Silicon germanium; Space charge; Temperature; Thyristors; SiGe HBT; Silicon-germanium; heterojunction bipolar transistor; superjunction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bipolar/BiCMOS Circuits and Technology Meeting, 2009. BCTM 2009. IEEE
  • Conference_Location
    Capri
  • ISSN
    1088-9299
  • Print_ISBN
    978-1-4244-4894-4
  • Electronic_ISBN
    1088-9299
  • Type

    conf

  • DOI
    10.1109/BIPOL.2009.5314140
  • Filename
    5314140