Title :
Build-in-self-test of a real time digital signal processing system
Author :
Yuan, Haipeng ; Long, Teng ; Yue, Yansheng
Author_Institution :
Dept. of Electron. Eng., Beijing Inst. of Technol., China
Abstract :
A new method of built-in self-test of a real time digital signal processor is offered. This method is a hybrid one of board-level testing and system-level testing. It can integrate system adjustment, on-line testing and off-line testing in one BIST architecture. The implementation of the BIST is offered and the performance of the time domain processing test and frequency domain processing test are analysed
Keywords :
Doppler radar; automatic testing; built-in self test; frequency-domain analysis; radar signal processing; telecommunication equipment testing; time-domain analysis; BIST; board-level testing; built-in self-test; frequency domain processing; off-line testing; on-line testing; real time digital signal processor; system adjustment; system-level testing; time domain processing; Built-in self-test; Circuit faults; Circuit testing; Digital signal processing; Digital signal processors; Frequency domain analysis; Random access memory; Read-write memory; Real time systems; System testing;
Conference_Titel :
Radar, 2001 CIE International Conference on, Proceedings
Conference_Location :
Beijing
Print_ISBN :
0-7803-7000-7
DOI :
10.1109/ICR.2001.984875
