• DocumentCode
    2265823
  • Title

    UV light irradiation for optical damage control in near-stoichiometric LiNbO/sub 3/

  • Author

    Kitamura, Kokoro ; Liu, Yanbing ; Jayavel, R. ; Nakamura, Mitsutoshi ; Kurimura, Sunao ; Hatano, Hiroshi

  • Author_Institution
    Adv. Mater. Lab., Nat. Inst. for Mater. Sci., Ibaraki, Japan
  • fYear
    2002
  • fDate
    24-24 May 2002
  • Firstpage
    230
  • Abstract
    Summary form only given. The electric field required for ferroelectric domain switching in near-stoichiometric LiNbO/sub 3/ (SLN) is decreased to be less than 4 kV/mm, which is about one fifth of the field for congruent conventional LiNbO/sub 3/ (CLN). This low coercive field in SLN has increased the interest in domain engineering for optical devices in a variety of frequency conversion applications. However, the photorefractive damage causing a beam fanning is enhanced in SLN and this poses serious limitation on using this material for UV frequency conversion. In this study, the photovoltaic coefficient (Glass constant) and photoconductivity of SLN have been measured at two different wavelengths (532 nm green and 350 nm UV lights). It has been confirmed that the optical damage hardly occurs under the irradiation of UV light in SLN as well as in near-stoichiometric LT. Using this result, the optical damage caused by 532 mn green laser can be suppressed by the UV light irradiation by superimposing it on the green light path in LN crystal.
  • Keywords
    electric domains; ferroelectric materials; ferroelectric switching; laser beam effects; lithium compounds; optical frequency conversion; optical materials; photoconductivity; photorefractive materials; photovoltaic effects; stoichiometry; ultraviolet radiation effects; 350 nm; 532 nm; Glass constant; LiNbO/sub 3/; UV light irradiation; beam fanning; domain engineering; electric field; ferroelectric domain switching; frequency conversion applications; low coercive field; near-stoichiometric LiNbO/sub 3/; optical damage control; optical devices; photoconductivity; photorefractive damage; photovoltaic coefficient; Ferroelectric materials; Frequency conversion; Lighting control; Optical control; Optical devices; Optical materials; Photoconducting materials; Photorefractive effect; Photorefractive materials; Photovoltaic systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
  • Conference_Location
    Long Beach, CA, USA
  • Print_ISBN
    1-55752-706-7
  • Type

    conf

  • DOI
    10.1109/CLEO.2002.1033882
  • Filename
    1033882