DocumentCode :
2266197
Title :
Evaluating modified rainfall erosivity factors in the universal soil loss equation
Author :
Golson, K.F. ; Tsegaye, T.D. ; Rajbhandari, N.B. ; Green, T.H. ; Coleman, T.L.
Author_Institution :
Center for Hydrology, Soil Climatology & Remote Sensing, Alabama A&M Univ., Normal, AL, USA
Volume :
5
fYear :
2000
fDate :
2000
Firstpage :
2017
Abstract :
Throughout the years, the Universal Soil Loss Equation (USLE) has undergone numerous modifications and revisions to enhance its ability to estimate soil loss caused by erosion in agricultural lands. Yet, there is still a considerable amount of uncertainty surrounding the use of the USLE as well as some of its modifications. This research examines the prediction capabilities of two very similar modifications that were made to the USLE´s rainfall erosivity (R) factor; they are termed the Modified Universal Soil Loss Equation (MUSLE) and the Onstad-Foster Equation. The efficiency of these two modifications will be evaluated by comparing the actual erosion data that was retrieved from the field site to the erosion data that was simulated using the Erosion Productivity Impact Calculator (EPIC) Model. This experiment, which is being conducted at the Winfred A. Thomas Agricultural Research Station in Hazel Green, Alabama aims to enhance our understanding, estimation, and prediction of the soil erosion process
Keywords :
agriculture; erosion; geomorphology; rain; soil; EPIC Model; Erosion Productivity Impact Calculator; MUSLE; Modified Universal Soil Loss Equation; Onstad-Foster Equation; USLE; agricultural land; agriculture; calculation; erosion; geomorphology; land surface; model; modification; modified rainfall erosivity factor; rain; revision; soil; soil erosion; soil loss; universal soil loss equation; Equations; Facsimile; Hydrology; Information retrieval; Remote sensing; Sediments; Soil; Storms; Telephony; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-6359-0
Type :
conf
DOI :
10.1109/IGARSS.2000.858251
Filename :
858251
Link To Document :
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