DocumentCode :
2266259
Title :
Semantic classification by covariance descriptors within a randomized forest
Author :
Kluckner, Stefan ; Bischof, Horst
Author_Institution :
Inst. for Comput. Graphics & Vision, Graz Univ. of Technol., Graz, Austria
fYear :
2009
fDate :
Sept. 27 2009-Oct. 4 2009
Firstpage :
665
Lastpage :
672
Abstract :
This paper investigates an approach to perform semantic classification in aerial imagery by compactly integrating multiple feature cues, like appearance and 3D height information. We therefore propose a novel technique to incorporate powerful covariance region descriptors into the decision nodes of a randomized forest framework efficiently. The concept of finding reliable binary splits is based on repeated random sampling of distributions that are specified by mean vectors and covariance matrices. The sampling strategy is related to Monte Carlo simulations and perfectly fits the learning strategy of randomized decision trees, while the covariance descriptors are exploited to perform a plausible feature cue integration. To show state-of-the-art performance, we first evaluate our proposed approach on the MSRC dataset including 21 object classes. Then, we illustrate how an additional integration of 3D information improves the classification accuracy in real world aerial images taken from Dallas, San Francisco, and Graz. In addition, we use the available camera data and 3D information to combine the overlapping per-image classifications into a large-scale semantic description map that is directly applicable to virtual or procedural 3D modeling of urban environments.
Keywords :
Monte Carlo methods; decision trees; image classification; Monte Carlo simulations; aerial imagery; covariance descriptors; randomized decision trees; randomized forest framework; semantic classification; Buildings; Data mining; Image classification; Image segmentation; Large-scale systems; Layout; Radio frequency; Sampling methods; Shape; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision Workshops (ICCV Workshops), 2009 IEEE 12th International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4244-4442-7
Electronic_ISBN :
978-1-4244-4441-0
Type :
conf
DOI :
10.1109/ICCVW.2009.5457638
Filename :
5457638
Link To Document :
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