DocumentCode
2267220
Title
Optical scattering analysis by dielectric and metallic spheres on oxidized silicon wafers
Author
Gong, Lei ; Wu, Zhensen
Author_Institution
Sch. of Sci., Xidian Univ., Xi´´an, China
fYear
2010
fDate
Nov. 29 2010-Dec. 2 2010
Firstpage
1093
Lastpage
1096
Abstract
The optical scattering properties for dielectric and metallic spheres upon oxidized silicon wafers are focused on in this paper. Taking the advantage of the BV (Bobbert and Vileger) theorem, the scattering model between a wafer and the particle is established. The scattering process is analysed and the scattering coefficients are derived through expansion vector spherical harmonic function. The differential scattering cross section (DSCS) of the spheres upon the wafers is calculated and the correlation between scattering angle, size of the particle, SiO2 layer thickness, the distance between substrate and spheres,and DSCS are discussed in detail.
Keywords
elemental semiconductors; light scattering; optical materials; particle size; silicon; silicon compounds; Bobbert and Vileger theorem; DSCS; Si; SiO2; differential scattering cross section; expansion vector spherical harmonic function; optical scattering analysis; oxidized silicon wafers; particle size; scattering angle; scattering coefficients; silicon wafers;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas Propagation and EM Theory (ISAPE), 2010 9th International Symposium on
Conference_Location
Guangzhou
Print_ISBN
978-1-4244-6906-2
Type
conf
DOI
10.1109/ISAPE.2010.5696667
Filename
5696667
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