• DocumentCode
    2267220
  • Title

    Optical scattering analysis by dielectric and metallic spheres on oxidized silicon wafers

  • Author

    Gong, Lei ; Wu, Zhensen

  • Author_Institution
    Sch. of Sci., Xidian Univ., Xi´´an, China
  • fYear
    2010
  • fDate
    Nov. 29 2010-Dec. 2 2010
  • Firstpage
    1093
  • Lastpage
    1096
  • Abstract
    The optical scattering properties for dielectric and metallic spheres upon oxidized silicon wafers are focused on in this paper. Taking the advantage of the BV (Bobbert and Vileger) theorem, the scattering model between a wafer and the particle is established. The scattering process is analysed and the scattering coefficients are derived through expansion vector spherical harmonic function. The differential scattering cross section (DSCS) of the spheres upon the wafers is calculated and the correlation between scattering angle, size of the particle, SiO2 layer thickness, the distance between substrate and spheres,and DSCS are discussed in detail.
  • Keywords
    elemental semiconductors; light scattering; optical materials; particle size; silicon; silicon compounds; Bobbert and Vileger theorem; DSCS; Si; SiO2; differential scattering cross section; expansion vector spherical harmonic function; optical scattering analysis; oxidized silicon wafers; particle size; scattering angle; scattering coefficients; silicon wafers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas Propagation and EM Theory (ISAPE), 2010 9th International Symposium on
  • Conference_Location
    Guangzhou
  • Print_ISBN
    978-1-4244-6906-2
  • Type

    conf

  • DOI
    10.1109/ISAPE.2010.5696667
  • Filename
    5696667