Efficient multisine testing of analog circuits

Author

Nagi, Naveena ; Chatterjee, Abhijit ; Balivada, Ashok ; Abraham, Jacob A.

Author_Institution

LogicVision, San Jose, CA, USA

fYear

1995

fDate

4-7 Jan 1995

Firstpage

234

Lastpage

238

Abstract

An efficient method has been developed for generating test waveforms for linear analog circuits which minimize the test effort and maximize the test confidence. The method makes use of a fault-based automatic test pattern generator (ATPG) to generate a set of test frequencies. A successive gradient method is used to combine these individual sinusoidal signals in a way that maximizes the fault coverage. The compressed waveform can be stored on-chip and used for built-in test of analog circuits

Keywords

analogue integrated circuits; automatic testing; biquadratic filters; built-in self test; fault diagnosis; integrated circuit testing; waveform analysis; AC testing; analog IC; analog circuits; biquadratic filter; built-in test; fault coverage maximization; fault-based automatic test pattern generator; linear analog circuits; multisine testing; sinusoidal signals; successive gradient method; test confidence; test waveform generation; Analog circuits; Analog computers; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Frequency response; Jacobian matrices; Logic testing; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Design, 1995., Proceedings of the 8th International Conference on

Conference_Location

New Delhi

ISSN

1063-9667

Print_ISBN

0-8186-6905-5

Type

conf

DOI

10.1109/ICVD.1995.512115

Filename

512115