• DocumentCode
    22704
  • Title

    Complementary Dual-Contact Switch Using Soft and Hard Contact Materials for Achieving Low Contact Resistance and High Reliability Simultaneously

  • Author

    Yong-Ha Song ; Min-Wu Kim ; Jeong Oen Lee ; Seung-Deok Ko ; Jun-Bo Yoon

  • Author_Institution
    Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
  • Volume
    22
  • Issue
    4
  • fYear
    2013
  • fDate
    Aug. 2013
  • Firstpage
    846
  • Lastpage
    854
  • Abstract
    This paper reports a dual-contact microelectromechanical switch, which consists of two contacts in a single switch: one with a soft contact material and the other with a hard contact material to achieve low contact resistance and high reliability at the same time under hot switching conditions. In a single switching operation, the proposed dual-contact switch makes contact twice in sequence, where the first contact is made with a hard contact material (Pt-to-Pt) that can withstand an abrupt hot switching condition (high electric field or micro-arcing). The second contact is then accomplished with the soft contact material (Au-to-Au) that has low-contact resistance, through which most of the current flows. In contrast, when the switch releases contact, the Au-to-Au contact is initially detached, and this is followed by the release of the Pt-to-Pt contact. In this way, the dual-contact switch showed longer lifetime than that of a single Au-to-Au contact-only switch by up to fortyfold, and even better lifetime than that of a single Pt-to-Pt contact-only switch by more than two times in open laboratory environments (unpackaged). At the same time, contact resistance of the dual-contact switch was under 0.3 Ω at 50 V of the gate voltage, which is more than seven times smaller than that of the single Pt-to-Pt contact-only switch (2.2 Ω), due to the Au-to-Au contact sub-switch (the contact resistance of the single Au-to-Au contact-only switch was 2.2 Ω).
  • Keywords
    contact resistance; electric field effects; microswitches; reliability; Au-to-Au contact; Pt-to-Pt contact; complementary dual-contact switch; dual-contact microelectromechanical switch; electric field; hard contact materials; hot switching; low contact resistance; microarcing; open laboratory environments; reliability; soft contact materials; Contact material; MEMS switch; contact resistance; microelectromechanical systems (MEMS) relay; microswitch; reliability;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2013.2248125
  • Filename
    6502645