Title :
"ATE open system platform" IEEE-P1552 structured architecture for test systems (SATS)
Author :
Stora, Michael J. ; Droste, David
Author_Institution :
Modular Integration Technol., Boonton, NJ, USA
Abstract :
The IEEE-P1552 structured architecture for test systems (SATS) standards effort, is a multidimensional ATE "open system platform" packaging specification. The standard defines data/signal/power interconnect mechanical/electrical mating connector requirements and common hardware packaging form factors. Addressed are plug&play wiring panels, switchable instrument/power mezzanine (IPM) modules, high speed serial bus control, and test bus matrix functionality, that permit subelement interchangeability and interoperability. The standard\´s functional performance requirements are limited to mechanical engagement, connector styles/footprints, electrical pin characteristics, and pin mapping definitions. As a higher order plug&play architecture, SATS supports legacy VXIbus and PXIbus architectures as hybrid subsystem integrations.
Keywords :
IEEE standards; automatic test equipment; electric connectors; electronics packaging; open systems; peripheral interfaces; ATE open system platform; IEEE-P1552 standard; IPM; PXIbus; SATS; VXIbus; connector styles/footprints; data interconnect; electrical connectors; electrical pin characteristics; hardware packaging form factors; high speed serial bus control; hybrid subsystems; instrument mezzanine modules; interchangeability; interoperability; mechanical engagement; mechanical mating connector requirements; multidimensional ATE; pin mapping definitions; plug&play wiring panels; power interconnect; signal interconnect; structured architecture for test systems; switchable power modules; test bus matrix functionality; Connectors; Costs; Electronic equipment testing; Electronics packaging; Hardware; Open systems; Standards organizations; System testing; US Department of Defense; Wiring;
Conference_Titel :
AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
Print_ISBN :
0-7803-7837-7
DOI :
10.1109/AUTEST.2003.1243559
