Title :
An application of membrane probes for on-wafer testing of unmatched high power MMICs
Author :
Tonks, D. ; Vaillancourt, W. ; Smith, K. ; Strid, E.
Author_Institution :
Raytheon Adv. Dev. Ctr., Andover, MA, USA
Abstract :
A membrane probe capable of determining large signal power handling capabilities of discrete and partially matched large periphery FETs at microwave frequencies has been developed. This paper describes the application and implementation of a membrane probe for a 15.7 mm partially matched 6 W power amplifier MMIC that employs off-chip matching networks for a high volume multichip module application.
Keywords :
MMIC power amplifiers; field effect MMIC; impedance matching; integrated circuit testing; probes; 6 W; large signal power handling capabilities; membrane probes; microwave frequencies; multichip module application; off-chip matching networks; on-wafer testing; partially matched large periphery FETs; power amplifier; unmatched high power MMICs; Biomembranes; FETs; High power amplifiers; Impedance matching; MMICs; Probes; Production; Radio frequency; Radiofrequency amplifiers; Testing;
Conference_Titel :
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-3246-6
DOI :
10.1109/MWSYM.1996.512172
