Universal high speed RF/microwave test system

Author

Hatch, Robert R. ; Brandeberry, Randall ; Knox, William

Author_Institution

Raytheon Co., Sudbury, MA, USA

fYear

2003

fDate

22-25 Sept. 2003

Firstpage

161

Lastpage

171

Abstract

This paper describes a high speed and high performance RF test system targeted for a moderate to high quantity manufacturing environment, integrating state of the art capabilities in high speed RF testing, microwave synthetic instrument measurement techniques, product interfacing and calibration. The RF Multi-function Test System (RFMTS) was developed to support a wide variety of RF test demands, targeted at radically reducing test times.

Keywords

calibration; computerised instrumentation; electronic equipment testing; microwave measurement; military equipment; production testing; test equipment; RF Multi-function Test System; RFMTS; calibration; high speed RF testing; microwave synthetic instrument measurement techniques; product interfacing; test times; universal high speed RF/microwave test system; Assembly systems; Calibration; Costs; Instruments; Measurement techniques; Microwave theory and techniques; Radio frequency; Solid state circuits; Switches; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings

ISSN

1080-7725

Print_ISBN

0-7803-7837-7

Type

conf

DOI

10.1109/AUTEST.2003.1243572

Filename

1243572

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2270752