Title :
Comparative study of the optical feedback sensitivity of oxide-confined vs. proton-implanted VCSELs
Author :
Judge, P.A. ; Quay, C.H.L. ; Hudgings, J.A.
Author_Institution :
Phys. Dept., Mount Holyoke Coll., South Hadley, MA, USA
Abstract :
Summary from only given. We compare the relative sensitivity to feedback of oxide-confined VCSELs to that of proton implanted devices. The devices used in this work are 850 nm VCSELs designed to lase in a single-transverse mode, using either proton implantation or oxide-confinement. We have estimated the coupling efficiency of the external cavity to each VCSEL using two independent experimental techniques.
Keywords :
ion implantation; laser feedback; laser modes; semiconductor lasers; sensitivity; surface emitting lasers; 850 nm; VCSELs; coupling efficiency; external cavity; feedback; independent experimental techniques; oxide-confined VCSELs; oxide-confinement; proton implantation; proton-implanted devices; relative sensitivity; single-transverse mode; Laser feedback; Optical coupling; Optical feedback; Optical polarization; Optical refraction; Optical variables control; Protons; Stability; Threshold current; Vertical cavity surface emitting lasers;
Conference_Titel :
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-706-7
DOI :
10.1109/CLEO.2002.1034174
