• DocumentCode
    2272045
  • Title

    Test coverage and post-verification defects: A multiple case study

  • Author

    Mockus, Audris ; Nagappan, Nachiappan ; Dinh-Trong, Trung T.

  • Author_Institution
    Avaya Labs. Res., Basking Ridge, NJ, USA
  • fYear
    2009
  • fDate
    15-16 Oct. 2009
  • Firstpage
    291
  • Lastpage
    301
  • Abstract
    Test coverage is a promising measure of test effectiveness and development organizations are interested in cost-effective levels of coverage that provide sufficient fault removal with contained testing effort. We have conducted a multiple-case study on two dissimilar industrial software projects to investigate if test coverage reflects test effectiveness and to find the relationship between test effort and the level of test coverage. We find that in both projects the increase in test coverage is associated with decrease in field reported problems when adjusted for the number of prerelease changes. A qualitative investigation revealed several potential explanations, including code complexity, developer experience, the type of functionality, and remote development teams. All these factors were related to the level of coverage and quality, with coverage having an effect even after these adjustments. We also find that the test effort increases exponentially with test coverage, but the reduction in field problems increases linearly with test coverage. This suggests that for most projects the optimal levels of coverage are likely to be well short of 100%.
  • Keywords
    program testing; program verification; software metrics; software quality; code complexity; cost-effective level; developer experience; industrial software project; organization development; post-verification defect; remote development team; software measure; software quality; test coverage; Computer industry; Control systems; Industrial relations; Lead; Programming; Software engineering; Software measurement; Software quality; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Empirical Software Engineering and Measurement, 2009. ESEM 2009. 3rd International Symposium on
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    1938-6451
  • Print_ISBN
    978-1-4244-4842-5
  • Electronic_ISBN
    1938-6451
  • Type

    conf

  • DOI
    10.1109/ESEM.2009.5315981
  • Filename
    5315981