DocumentCode
227216
Title
Vacuum apparatus for thermal testing of electronic equipments
Author
Avagyan, Vardan Sh ; Danielyan, Vahe A. ; Gevorgyan, Artur A. ; Simonyan, Avetis S. ; Mkrtchyan, Tigran H. ; Vardanyan, Vahagn V.
Author_Institution
CANDLE Synchrotron Res. Inst., Yerevan, Armenia
fYear
2014
fDate
June 30 2014-July 4 2014
Firstpage
1
Lastpage
1
Abstract
In this paper is presented an apparatus for measurement of thermophysical parameters and control of quality of equipments in high vacuum also in high and low temperature conditions. The equipment gives possibility to explore the measurement dynamics depending on level of temperature and vacuum, also tightness control of joints of materials.
Keywords
electronic equipment testing; quality control; thermal analysis; vacuum apparatus; vacuum measurement; electronic equipments; measurement dynamics; quality control; thermal testing; thermophysical parameters; tightness control; vacuum apparatus; Extraterrestrial measurements; Materials; Sensors; Sun; Temperature dependence; Temperature measurement; Vacuum technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electron Sources Conference (IVESC), 2014 Tenth International
Conference_Location
St. Petersburg
Print_ISBN
978-1-4799-5770-5
Type
conf
DOI
10.1109/IVESC.2014.6891944
Filename
6891944
Link To Document