DocumentCode :
2272271
Title :
A novel Markov model for the reliability prediction of fault tolerant non-homogenous multipipelines
Author :
Al-Asaad, Hussain
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
fYear :
2003
fDate :
22-25 Sept. 2003
Firstpage :
664
Lastpage :
669
Abstract :
A novel Markov model for the reliability prediction of fault-tolerant non-homogenous VLSI and WSI multipipeline arrays is presented. The PEs (processing elements) of the array are assumed to fail independently (with a constant failure rate) at different moments and the transition rate between two different error states is constant. A total system failure is reached when the number of working pipelines becomes less than a predetermined number Sm. Thus the reliability of the multipipeline array is defined as the probability of having S(t) greater than or equal to S, where S(t) is the number of survived pipelines at time t, and Sm is the minimum number of survived pipelines that is needed for the multipipeline to be considered in a working condition. In addition to predicting the reliability, the Markov model can be used in design optimization to determine the best possible design among multiple alternatives. Several experiments are conducted that demonstrate the ability of the proposed Markov model to predict the reliability and to evaluate various design alternatives.
Keywords :
Markov processes; VLSI; circuit optimisation; fault tolerant computing; integrated circuit reliability; parallel processing; pipeline processing; wafer-scale integration; Markov model; PE constant failure rate; VLSI; WSI; design optimization; fault tolerant multipipelines; multipipeline arrays; nonhomogenous multipipelines; processing elements; reliability prediction; total system failure; wafer scale integration; working pipeline number; Digital signal processing; Employee welfare; Fault tolerance; Hardware; Multiprocessor interconnection networks; Pipelines; Predictive models; Reliability engineering; Supercomputers; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
ISSN :
1080-7725
Print_ISBN :
0-7803-7837-7
Type :
conf
DOI :
10.1109/AUTEST.2003.1243648
Filename :
1243648
Link To Document :
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