Title :
Interface method of digital devices testing
Author :
Grishkin, Valery ; Yelaev, Yevgeny ; Lopatkin, Grigory ; Mikhailov, Alexander ; Ovsyannikov, Dmitri
Author_Institution :
St.-Peterburg State Univ., St. Petersburg, Russia
fDate :
June 30 2014-July 4 2014
Abstract :
The method of constructing testing impacts for digital devices is proposed. The method is based on the representation device as a set of models data exchange interfaces. This approach allows to build models of input impacts as a collection of standard operations inherent to the corresponding interface.
Keywords :
digital circuits; electronic data interchange; electronic equipment testing; test equipment; data exchange interfaces; digital device testing; interface method; representation device; Data models; Educational institutions; Electronic mail; Mathematical model; Simulation; Standards; Testing;
Conference_Titel :
Vacuum Electron Sources Conference (IVESC), 2014 Tenth International
Conference_Location :
St. Petersburg
Print_ISBN :
978-1-4799-5770-5
DOI :
10.1109/IVESC.2014.6891994
